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Ultra high resolution Schottky field emission scanning electron microscope SU8700
With the development of rapid data collection and processing technology, electron microscopes have entered an era where not only data quality is empha
Product details
Ultra high resolution Schottky field emission scanning electron microscope SU8700
With the development of rapid data collection and processing technology, electron microscopes have entered an era where not only data quality is emphasized, but also the collection process is taken into account. SU8700, as a SEM designed for the new era, adds high-throughput functions such as automatic data acquisition on the basis of Hitachi electron microscopes' high image quality and stability.
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- The equipment photo includes optional features.
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characteristic
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specifications
characteristic
Ultra high resolution observation and super strong analytical ability
Hitachi's high brightness Schottky field emission electron gun can simultaneously support ultra-high resolution observation and fast microbeam analysis. Without using a sample stage for deceleration, high-resolution observation can still be achieved with only a low acceleration voltage of 0.1 kV, which is suitable for more application scenarios. At the same time, it can be paired with various new detectors and other rich optional items to meet more observation needs.
Advanced automation functions*
EM Flow Creator allows customers to create automated workflows for continuous image acquisition. EM Flow Creator defines different SEM functions as graphical modules, such as setting magnification, moving sample position, adjusting focal length, and contrast between light and dark. Users can form a working program by simply dragging and dropping these modules in logical order. After debugging and confirmation, the program can automatically obtain high-quality and reproducible image data every time it is called.
Powerful display and interaction features
Native support for dual displays, providing flexible and efficient operating space.
Simultaneous display and storage of 6 channels enables fast multi signal observation and acquisition, bringing more information.
Single scan supports up to 40960 × 30720 ultra-high pixels*
Large field of view and high pixel imaging
The left image is a high-resolution image of a rat ultra-thin slice sample collected in a single scan with a field of view of approximately 120 μ m. Enlarge the yellow rectangular area image with simple numbers to obtain the image on the right. The figure on the right is equivalent to enlarging the numbers on the left by 20 times, and the internal structure of organelles and other components of nerve cells can still be clearly confirmed
The SU8600 and SU8700 can achieve a maximum of 40960 x 30720 pixels in a single scan*
*Optional selection
specifications
| electronic optical system | Secondary electronic resolution | zero point eight nm@15 kV |
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| zero point nine nm@1 kV | ||
| Magnification factor | 20 ~ 2,000,000 x | |
| electron gun | Schottky field emission electron source | |
| Accelerating Voltage | 0.1 ~ 30 kV | |
| Landing voltage*1,*3 | 0.01 ~ 7 kV | |
| Maximum beam current | 200 nA | |
| detector | Standard detector | Upper detector (UD) |
| Lower detector (LD) | ||
| Optional detector*3 | Backscattered electron detector (MD) inside the tube | |
| Semiconductor type backscattered electron detector (PD-BSE) | ||
| High sensitivity low vacuum detector (UVD) | ||
| Scanning Transmission Detector (STEM) | ||
| Optional accessories*2 | X-ray energy spectrometer (EDS) | |
| Electron backscatter diffraction detector (EBSD) | ||
| sample stage | Motor drive shaft | 5-axis motor drive |
| moving range | ||
| X | 0 ~ 110 mm | |
| Y | 0 ~ 110 mm | |
| Z | 1.5 ~ 40 mm | |
| T | -5 ~ 70° | |
| R | 360° | |
| sample room | Sample size | Maximum diameter: 150 mm*4 |
| Low vacuum mode | Vacuum range | 5 ~ 300 Pa |
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- Under deceleration mode
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- Configurable detector
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- Optional items
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- If you have a larger sample size requirement, please contact us.
Related product classification
- Focused Ion Beam System (FIB/FIB-SEM)
- TEM/SEM Sample Preparation Device
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